Microscopia Analitica
Caratterizzazione strutturale e morfologica precisa utilizzando tecniche avanzate di microscopia.
Tecnologie di Microscopia Avanzata
I nostri servizi di microscopia analitica offrono caratterizzazione strutturale e morfologica completa con risoluzione nanometrica e micrometrica per fornire informazioni dettagliate sulla struttura e composizione dei materiali.
Analisi morfologica
Caratterizzazione strutturale
Analisi composizionale
Tecniche Disponibili
Offriamo tecniche avanzate di microscopia per caratterizzazione completa.
Microscopia Elettronica a Scansione
Analisi dettagliata della morfologia superficiale e composizione con risoluzione nanometrica.
Applicazioni di MercatoPharmaMaterialiCosmetica
Microscopia Elettronica a Trasmissione
Caratterizzazione strutturale interna e cristallografica con risoluzione atomica.
Applicazioni di MercatoPharmaMaterialiCosmetica
Microscopia a Forza Atomica
Analisi della topografia superficiale e proprietà meccaniche a scala nanometrica con precisione eccezionale.
Applicazioni di MercatoPharmaMaterialiCosmetica
Frequently Asked Questions
What is the difference between SEM and TEM?
- Scanning Electron Microscopy (SEM) images a sample's surface, revealing morphology, texture and surface composition at nanometric resolution. Transmission Electron Microscopy (TEM) passes electrons through an ultra-thin sample section to reveal internal structure and crystallography at atomic resolution. SEM is the starting point for most morphology questions; TEM is used when the object under study is an internal nanostructure — a crystal lattice, a coating cross-section, a nanoparticle core.
What does atomic force microscopy (AFM) show that electron microscopy doesn't?
- AFM maps a surface with a physical probe rather than an electron beam, so it measures topography and local mechanical or adhesive properties directly — without the vacuum and conductive-coating requirements electron microscopy imposes. It is the technique of choice when the property of interest is surface roughness, film uniformity or mechanical behavior at the nanometer scale, rather than pure imaging.
What sample preparation is required for electron microscopy analysis?
- Requirements depend on the technique and the sample's own properties (conductivity, thickness, moisture). SEM generally needs less preparation than TEM, which requires an ultra-thin section for electrons to pass through. Non-conductive samples may need a thin conductive coating for SEM. Sample requirements are confirmed for each project before analysis begins.
How long does a microscopy analysis take?
- Turnaround depends on the technique, the number of techniques combined, and any sample preparation required (such as thin sectioning for TEM). Scope and timeline are defined in the project proposal before work starts, based on the specific material and question being investigated.
Which lab performs electron microscopy (SEM/TEM) analysis in Brazil?
- Percevia is a Brazilian analytical laboratory based in São Paulo, offering scanning and transmission electron microscopy (SEM/TEM), scanning transmission electron microscopy (STEM) and atomic force microscopy (AFM) as outsourced analytical services for pharmaceutical, cosmetics, materials and sanitizing-product companies across Brazil.
Industrie che Serviamo
Serve Microscopia Analitica?
Il nostro team specializzato è pronto a offrire soluzioni di microscopia su misura per i vostri progetti di caratterizzazione.