X-ray Analysis
Precise structural characterization through advanced X-ray diffraction and scattering techniques.
Advanced X-ray Technologies
Our X-ray analysis services offer complete structural characterization and crystalline phase identification, using advanced diffraction and scattering techniques to provide precise information about structure and molecular organization of materials.
Structural analysis
Phase identification
Crystalline characterization
Available Techniques
We offer advanced X-ray analysis techniques for complete structural characterization.
Small Angle X-ray Scattering
Structural analysis of nanostructured systems and molecular organization in solution.
X-ray Diffraction
Crystal structure determination and phase identification through X-ray diffraction patterns.
Computed Microtomography
Non-destructive three-dimensional analysis of internal material structure.
Need X-ray Analysis?
Our specialized team is ready to offer tailored X-ray analysis solutions for your structural characterization projects.